Technique for analysis of replicates of polished composite cross-sections as well as ion beam thinned composite sections. This method allows the determination of assemblages and microchemical composition of the matrix and fiber/matrix interfacial regions to a fine degree of spatial resolution.

A Transmission Electron Microscope (TEM) passes the electron beam through a very thin slice of a specimen. A Scanning Electron Microscope (SEM) looks at the exterior of a specimen. A Scanning Transmission Electron Microscope (STEM) can produce a magnification of 90 million times.